Beilstein J. Nanotechnol.2019,10, 1056–1064, doi:10.3762/bjnano.10.106
roughness of dielectric films with increasing film thickness.
Keywords: capacitive coupling; electrostatic effects; magnetic force microscopy; nanoparticles; superparamagneticironoxidenanoparticle (SPION); Introduction
MFM has become an important tool for studying magnetic properties of surface
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Figure 1:
Phase shift as a function of the tip–substrate distance z; calculated for a silicon substrate with V...