Search results

Search for "superparamagnetic iron oxide nanoparticle (SPION)" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.

Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

  • Alexander Krivcov,
  • Jasmin Ehrler,
  • Marc Fuhrmann,
  • Tanja Junkers and
  • Hildegard Möbius

Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106

Graphical Abstract
  • roughness of dielectric films with increasing film thickness. Keywords: capacitive coupling; electrostatic effects; magnetic force microscopy; nanoparticles; superparamagnetic iron oxide nanoparticle (SPION); Introduction MFM has become an important tool for studying magnetic properties of surface
PDF
Album
Supp Info
Full Research Paper
Published 17 May 2019
Other Beilstein-Institut Open Science Activities